<?xml version="1.0" encoding="UTF-8"?><ns2:project xmlns:ns1="http://gtr.rcuk.ac.uk/gtr/api" xmlns:ns2="http://gtr.rcuk.ac.uk/gtr/api/project" xmlns:ns3="http://gtr.rcuk.ac.uk/gtr/api/fund" xmlns:ns4="http://gtr.rcuk.ac.uk/gtr/api/person" xmlns:ns5="http://gtr.rcuk.ac.uk/gtr/api/project/outcome" xmlns:ns6="http://gtr.rcuk.ac.uk/gtr/api/organisation" ns1:created="2026-07-08T08:44:08Z" ns1:href="http://gtr.ukri.org/gtr/api/projects/AD6E51B7-2580-4234-BDA7-7F601A11C234" ns1:id="AD6E51B7-2580-4234-BDA7-7F601A11C234"><ns1:links><ns1:link ns1:href="http://gtr.ukri.org/gtr/api/persons/F1167464-93F9-4C6B-A92B-CF53C32D85F1" ns1:rel="PM_PER"/><ns1:link ns1:href="http://gtr.ukri.org/gtr/api/organisations/964A73A3-66DC-4C55-AB50-59AE3100C18E" ns1:rel="LEAD_ORG"/><ns1:link ns1:href="http://gtr.ukri.org/gtr/api/organisations/964A73A3-66DC-4C55-AB50-59AE3100C18E" ns1:rel="PARTICIPANT_ORG"/><ns1:link ns1:end="2027-05-30T23:00:00Z" ns1:href="http://gtr.ukri.org/gtr/api/funds/AD55E7D4-A9CF-4A1E-A0F1-1121F3683FBF" ns1:rel="FUND" ns1:start="2024-05-31T23:00:00Z"/></ns1:links><ns2:identifiers><ns2:identifier ns2:type="RCUK">10140505</ns2:identifier></ns2:identifiers><ns2:title>On-wafer microwave metrology for future industrial applications (On-Micro)</ns2:title><ns2:status>Active</ns2:status><ns2:grantCategory>EU-Funded</ns2:grantCategory><ns2:leadFunder>Horizon Europe Guarantee</ns2:leadFunder><ns2:abstractText>Semiconductor chips are used in many established and emerging applications, e. g. , 6G telecommunications, automotive radar sensors, space-deployed radiometers for earth monitoring, and wearable electronics for healthcare. However, there is currently a lack of traceable measurement techniques for millimetre-wave and terahertz (THz) planar integrated circuits (ICs), particularly those based on compound semiconductors. Thus, in order to strengthen the European semiconductor industry and facilitate the development of next-generation semiconductor technologies, new accurate and traceable on-wafer measurement techniques are needed together with best practice guides for on-wafer measurement. In addition, improved methods are needed for the characterisation of compound transistors above 110 GHz, and for novel 2D, thin film and semiconductor materials.</ns2:abstractText></ns2:project>