10022563Aletheia Imaging Solutions LtdClosedCollaborative R&DInnovate UKAletheia Imaging Solutions Ltd (AIS) is an industrial metrology spin out from The University of Manchester. At the heart of the AIS business plan is an innovative, patent pending, piece of technology, a 3D calibration target capable of permitting the calculation of spatial resolution and measurement confidence in X-ray Computed Tomography (XCT). The AIS 3D calibration target enables users to exploit the vast capabilities of XCT for non-destructive testing (NDT) purposes. Through detailed case studies performed in collaboration with industrial partners, the AIS approach to XCT metrology has been proven to be a reliable means for calibrating XCT equipment. The AIS approach is intended to allow XCT users to inspect additively manufactured (AM) components for defects in order to allow them to be deployed in mission critical applications. XCT can only be relied upon as an NDT method for mission critical components if the XCT instruments employed to carry out the inspections are calibrated and the corresponding spatial resolution and measurement confidence values are known. The AIS 3D calibration target provides these parameters. AM is much faster and more economical than alternative fabrication methods, so customers stand to achieve vast cost savings by using the AIS approach to enable AM to be employed as their chosen manufacturing technique. Although it is proven that the AIS 3D calibration target works and is a highly effective tool for XCT metrology, there is currently no way of calibrating the 3D calibration targets themselves. It is inevitable that errors in the manufacturing processes used to produce the AIS devices will result in small geometric variations between supposedly identical devices. In this project, AIS will work with the National Physical Laboratory (NPL) to develop a characterisation routine to use imaging techniques such as scanning electron microscopy to profile the dimensions of the features on the 3D calibration targets. It is intended that this routine will output a "fingerprint" of the characterised device, detailing any variations between the actual device under investigation and the idealised design. The project will seek to determine the optimal imaging technique for carrying out the characterisation and engage in the development of a digital solution to enable the results to be used in subsequent calculations using the AIS devices. Successful completion of the project will enhance the utility of the AIS 3D calibration targets and ensure AIS maintains its position as a world leader in the XCT metrology market.