ENIAC MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems (MODERN)
Lead Research Organisation:
University of Glasgow
Department Name: Electronics and Electrical Engineering
Abstract
Increasing CMOS device variability has become one of the most acute problems facing the semiconductor manufacturing and design industries at, and beyond, the 45 nm technology generation. From all possible sources of variability the statistical variability introduced by the discreteness of charge and granularity of matter in transistors with features already of molecular dimensions is the most problematic of all. In conjunction with the statistical variability the negative bias temperature instability (NBTI) and/or hot carrier degradation can result in acute statistical reliability problems. It is widely recognized that both technology computer aided design (TCAD) and electronic design automation (EDA) tools lack the essential capabilities to predict and compass the increasing variability and reliability problems in the technology and circuit design process. This deficiency, and the corresponding tool development needs, were highlighted in the Strategic Research Agenda (SRA) of the European Nanotechnology Platform ENIAC and in the ENIAC Joint Undertaking Multi-Annual Strategic Plan. It was prioritized in the first 2008 ENIAC call for proposals and the corresponding 2008 ENIAC Annual Work Programme. The European semiconductor and design industry, research institutes and selected academia based research groups have reacted swiftly to the ENIAC call putting together a powerful consortium to address the SP7 priorities. The DMG at Glasgow, which is a world leader in the simulation and forecasting of statistical variability, has been invited as a key partner in the corresponding ENIAC MODERN proposal. This proposal is part of the funding package designed to support the DMG participation in ENIAC MODERN and includes funding from ENIAC, EPSRC and Scottish Enterprise. This will affirm the UK's leadership position in this field but more importantly will make available the associated knowledge, expertise and simulation tools to the vibrant UK CMOS device and design communities and will give a competitive advantage to the vibrant UK design industry. It will also train experts at the interface between technology, devices and design which are much needed in the UK chiples and fables design companies like ARM, CSR, Wofson Microelectronics and the numerous UK SMEs with chip design activities.
Organisations
People |
ORCID iD |
Asen Asenov (Principal Investigator) | |
Scott Roy (Co-Investigator) |
Publications
Abid K
(2011)
Electrically tuneable spectral responsivity in gated silicon photodiodes
in Applied Physics Letters
Benbakhti B
(2011)
Numerical analysis of the new Implant-Free Quantum-Well CMOS: DualLogic approach
in Solid-State Electronics
Brown A
(2010)
Statistical Simulation of Progressive NBTI Degradation in a 45-nm Technology pMOSFET
in IEEE Transactions on Electron Devices
Cheng B
(2011)
Impact of NBTI/PBTI on SRAM Stability Degradation
in IEEE Electron Device Letters
Markov S
(2011)
Drain Current Collapse in Nanoscaled Bulk MOSFETs Due to Random Dopant Compensation in the Source/Drain Extensions
in IEEE Transactions on Electron Devices
Wang X
(2011)
Impact of STI on Statistical Variability and Reliability of Decananometer MOSFETs
in IEEE Electron Device Letters
Wang X
(2011)
Statistical Threshold-Voltage Variability in Scaled Decananometer Bulk HKMG MOSFETs: A Full-Scale 3-D Simulation Scaling Study
in IEEE Transactions on Electron Devices
Wang X
(2013)
Geometry, Temperature, and Body Bias Dependence of Statistical Variability in 20-nm Bulk CMOS Technology: A Comprehensive Simulation Analysis
in IEEE Transactions on Electron Devices
Description | Understanding of atomic scale variability in advanced CMOS and development of corresponding simulation tools. |
Exploitation Route | Incorporated in commercial TCAD software. |
Sectors | Electronics |
Description | IP licensed to Gold Standard Simulations, Ltd. |
First Year Of Impact | 2010 |
Sector | Electronics |
Impact Types | Economic |