Use of energy-filtered photoelectron emission microscopy and Kelvin probe force microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion (2014)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1504/ijnt.2014.063789
Publication URI: http://dx.doi.org/10.1504/ijnt.2014.063789
Type: Journal Article/Review
Parent Publication: International Journal of Nanotechnology
Issue: 9/10/11