BTI and leakage aware dynamic voltage scaling for reliable low power cache memories (2015)
Attributed to:
Resilient and Testable Energy-Efficient Digital Hardware
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iolts.2015.7229858
Publication URI: http://dx.doi.org/10.1109/iolts.2015.7229858
Type: Conference/Paper/Proceeding/Abstract