Optical thickness measurement with multi-wavelength THz interferometry (2014)
Attributed to:
Scottish Manufacturing Institute - Renewal, 2008 - 2013
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.optlaseng.2014.04.007
Publication URI: http://dx.doi.org/10.1016/j.optlaseng.2014.04.007
Type: Journal Article/Review
Parent Publication: Optics and Lasers in Engineering