QM/MM Methods for Crystalline Defects. Part 1: Locality of the Tight Binding Model (2016)

First Author: Chen H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1137/15m1022628

Publication URI: http://dx.doi.org/10.1137/15m1022628

Type: Journal Article/Review

Parent Publication: Multiscale Modeling & Simulation

Issue: 1