Thickness measurement of multi-layer conductive coatings using multifrequency eddy current techniques (2015)

First Author: Zhang D

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1080/10589759.2015.1081903

Publication URI: http://dx.doi.org/10.1080/10589759.2015.1081903

Type: Journal Article/Review

Parent Publication: Nondestructive Testing and Evaluation

Issue: 3