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Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques. (2016)

First Author: Barlow AJ
Attributed to:  University of Newcastle - Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927616011673

PubMed Identifier: 27619633

Publication URI: http://europepmc.org/abstract/MED/27619633

Type: Journal Article/Review

Volume: 22

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 5

ISSN: 1431-9276