Quantifying local thickness and composition in thin films of organic photovoltaic blends by Raman scattering (2017)

First Author: Rodríguez-Martínez X
Attributed to:  Microstructure of Organic Semiconductors Controlled by Solution Processing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c7tc01472d

Publication URI: http://dx.doi.org/10.1039/c7tc01472d

Type: Journal Article/Review

Parent Publication: Journal of Materials Chemistry C

Issue: 29