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Combined Atomic Force Microscopy and Photoluminescence Imaging to Increase the Yield of Quantum Dot Photonic Devices (2017)

First Author: Sapienza L

Attributed to: An Atomic Force Microscopy study of buried InAs/GaAs quantum-dot single-photon sources funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/fio.2017.fm2e.1

Publication URI: https://doi.org/10.1364/FIO.2017.FM2E.1

Type: Conference/Paper/Proceeding/Abstract