In situ ion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis (2016)
Attributed to:
University of Newcastle - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.6045
Publication URI: http://dx.doi.org/10.1002/sia.6045
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 1