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The Over-Reset Phenomenon in Ta 2 O 5 RRAM Device Investigated by the RTN-Based Defect Probing Technique (2018)

First Author: Chai Z

Attributed to: Variability-aware RRAM PDK for design based research on FPGA/neuro computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2018.2833149

Publication URI: http://dx.doi.org/10.1109/led.2018.2833149

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 7