Control of Interface Defects for Efficient and Stable Quasi-2D Perovskite Light-Emitting Diodes Using Nickel Oxide Hole Injection Layer. (2018)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/advs.201801350

PubMed Identifier: 30479940

Publication URI: http://europepmc.org/abstract/MED/30479940

Type: Journal Article/Review

Volume: 5

Parent Publication: Advanced science (Weinheim, Baden-Wurttemberg, Germany)

Issue: 11

ISSN: 2198-3844