Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample (2020)
Attributed to:
Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevmaterials.4.013801
Publication URI: http://dx.doi.org/10.1103/physrevmaterials.4.013801
Type: Journal Article/Review
Parent Publication: Physical Review Materials
Issue: 1