The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors (2021)
Attributed to:
Additive-Stabilized Polymer Electronics Manufacturing (ASPEM)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0044785
Publication URI: http://dx.doi.org/10.1063/5.0044785
Type: Journal Article/Review
Parent Publication: APL Materials
Issue: 4