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Putting High-Index Cu on the Map for High-Yield, Dry-Transferred CVD Graphene. (2023)

First Author: Burton OJ

Attributed to: Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.2c09253

PubMed Identifier: 36594782

Publication URI: http://europepmc.org/abstract/MED/36594782

Type: Journal Article/Review

Volume: 17

Parent Publication: ACS nano

Issue: 2

ISSN: 1936-0851