Exploring the Validity Limits of Direct Ptychographic Methods to Analyse 4D Scanning Transmission Electron Microscopy Datasets (2022)
Attributed to:
Fast Pixel Detectors: a paradigm shift in STEM imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622002380
Publication URI: http://dx.doi.org/10.1017/s1431927622002380
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S1