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Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope (2020)

First Author: Trager-Cowan C

Attributed to: Ultra-Stable High-Performance Single Nanolasers funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ab75a5

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85083289951

Type: Journal Article/Review

Parent Publication: Semiconductor Science and Technology

Issue: 5