Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope (2020)
Attributed to:
Ultra-Stable High-Performance Single Nanolasers
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ab75a5
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85083289951
Type: Journal Article/Review
Parent Publication: Semiconductor Science and Technology
Issue: 5