Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films (2019)

First Author: Trager-Cowan C
Attributed to:  Ultra-Stable High-Performance Single Nanolasers funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/prj.7.000b73

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85074723108

Type: Journal Article/Review

Parent Publication: Photonics Research

Issue: 11