Accurate Statistical Description of Random Dopant-Induced Threshold Voltage Variability (2008)

First Author: Millar C
Attributed to:  Meeting the design challenges of the nano-CMOS electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2008.2001030

Publication URI: http://dx.doi.org/10.1109/led.2008.2001030

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 8

ISSN: 07413106