High-precision atomic-scale strain mapping of nanoparticles from STEM images. (2022)

First Author: Luo X
Attributed to:  South of England Analytical Electron Microscope [ATEM] funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2022.113561

PubMed Identifier: 35640478

Publication URI: http://europepmc.org/abstract/MED/35640478

Type: Journal Article/Review

Volume: 239

Parent Publication: Ultramicroscopy

ISSN: 0304-3991