The Helium-Ion-Microscope Secondary-Ion-Mass-Spectrometer: A New Tool for Earth and Materials Science (2021)

First Author: Ball M

Attributed to: Development of high-resolution focussed ion beam-secondary ion mass spectrometry (FIB-SIMS) as a tool for Earth and Materials sciences funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.81765

Publication URI: https://www.repository.cam.ac.uk/handle/1810/334352

Type: Thesis