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Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. (2010)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2010.08.001

PubMed Identifier: 20888125

Publication URI: http://europepmc.org/abstract/MED/20888125

Type: Journal Article/Review

Volume: 110

Parent Publication: Ultramicroscopy

Issue: 12

ISSN: 0304-3991