Improved sensitivity at synchrotrons using edge illumination X-ray phase-contrast imaging (2013)

First Author: Diemoz P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/8/06/c06002

Publication URI: http://dx.doi.org/10.1088/1748-0221/8/06/c06002

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 06