Hierarchical Simulation of Statistical Variability: From 3-D MC With " ab initio" Ionized Impurity Scattering to Statistical Compact Models (2010)

First Author: Kovac U
Attributed to:  Meeting the design challenges of the nano-CMOS electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2010.2062517

Publication URI: http://dx.doi.org/10.1109/ted.2010.2062517

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 10