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Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. (2010)

First Author: Bennett SE

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3430539

PubMed Identifier: 20590240

Publication URI: http://europepmc.org/abstract/MED/20590240

Type: Journal Article/Review

Volume: 81

Parent Publication: The Review of scientific instruments

Issue: 6

ISSN: 0034-6748