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Mg dopant distribution in an AlGaN/GaN p-type superlattice assessed using atom probe tomography, TEM and SIMS (2010)

First Author: Bennett S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/209/1/012014

Publication URI: http://dx.doi.org/10.1088/1742-6596/209/1/012014

Type: Journal Article/Review

Parent Publication: Journal of Physics: Conference Series