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High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems (2008)

First Author: Oliver R
Attributed to:  Science Bridge Award USA: Harnessing Materials for Energy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1179/174328408x270301

Publication URI: http://dx.doi.org/10.1179/174328408x270301

Type: Journal Article/Review

Parent Publication: Materials Science and Technology

Issue: 6