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Key issues and techniques for characterizing Time-dependent Device-to-Device Variation of (2013)

First Author: Duan M

Attributed to: High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Conference/Paper/Proceeding/Abstract

Parent Publication: Technical Digest of the International Electron Devices Meeting (IEDM)