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Evaluation and Solutions for P/E Window Instability Induced by Electron Trapping in High-<inline-formula> <tex-math notation="TeX">$\kappa$ </tex-math></inline-formula> Intergate Dielectrics of Flash Memory Cells (2014)

First Author: Baojun Tang
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2014.2313041

Publication URI: http://dx.doi.org/10.1109/ted.2014.2313041

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 5