Probing the sensitivity of electron wave interference to disorder-induced scattering in solid-state devices (2012)

First Author: Scannell B

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.85.195319

Publication URI: http://dx.doi.org/10.1103/physrevb.85.195319

Type: Journal Article/Review

Parent Publication: Physical Review B

Issue: 19