📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Measurement of the physical and electronic properties of ordered nanoporous alumina using XUV excitation spectroscopy (2009)

First Author: Nasir M

Attributed to: Semiconductor Research at the Materials-Device Interface funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/42/19/195404

Publication URI: http://dx.doi.org/10.1088/0022-3727/42/19/195404

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 19

ISSN: 0022-3727