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Extremely Low Emittance Beam Size Diagnostics with Sub-Micrometer Resolution Using Optical Transition Radiation (2013)

First Author: K. Kruchinin, P. Karataev, B. Bolzon, T. Lefevre, S. Mazzoni, A.Aryshev, M. Shevelev, N. Terunuma, J. Urakawa

Attributed to: John Adams Institute supplement 2011/12 funded by STFC

Abstract

No abstract provided

Bibliographic Information

Type: Conference/Paper/Proceeding/Abstract

Issue: WEAL2