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Direct decay measurement of capacitance in a bismuth ferrite electroceramic (2012)

First Author: Leach C

Attributed to: SEM-based Technique for Local Property Measurements in Electroceramic Thick/Thin Films: Proof of Principle funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s10854-012-0877-4

Publication URI: http://dx.doi.org/10.1007/s10854-012-0877-4

Type: Journal Article/Review

Parent Publication: Journal of Materials Science: Materials in Electronics

Issue: 2