📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM Cooptimization (2015)

First Author: Asenov A

Attributed to: Atomic Scale Simulation of Nanoelectronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2014.2363117

Publication URI: http://dx.doi.org/10.1109/ted.2014.2363117

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 6