📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe (2016)

First Author: Edmondson P

Attributed to: In-Situ TEM Studies of Ion-Irradiated Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.scriptamat.2015.11.010

Publication URI: http://dx.doi.org/10.1016/j.scriptamat.2015.11.010

Type: Journal Article/Review

Parent Publication: Scripta Materialia