📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

SPICE Modeling of the Scaling of Resonant Tunneling Diodes and the Effects of Sidewall Leakage (2012)

First Author: Ternent G

Attributed to: Silicon Resonant Tunnelling Diodes and Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2219867

Publication URI: http://dx.doi.org/10.1109/ted.2012.2219867

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 12