Defect- and Variation-Tolerant Logic Mapping in Nanocrossbar Using Bipartite Matching and Memetic Algorithm (2016)

First Author: Yuan B

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tvlsi.2016.2530898

Publication URI: http://dx.doi.org/10.1109/tvlsi.2016.2530898

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Issue: 9