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Device and Circuit Performance of the Future Hybrid III-V and Ge-Based CMOS Technology (2016)

First Author: Benbakhti B

Attributed to: Multiscale Modelling of Metal-Semiconductor Contacts for the Next Generation of Nanoscale Transistors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2016.2603188

Publication URI: http://dx.doi.org/10.1109/ted.2016.2603188

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 10

ISSN: 00189383