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Adaptive Measurement and Modelling Methodology for In-line 3D Surface Metrology Scanners (2017)

First Author: Babu M

Attributed to: Self-Resilient Reconfigurable Assembly Systems with In-process Quality Improvement funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.procir.2017.01.009

Publication URI: http://dx.doi.org/10.1016/j.procir.2017.01.009

Type: Journal Article/Review

Parent Publication: Procedia CIRP