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'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups (2018)

First Author: Russell-Pavier F

Attributed to: Ultrafast Micro-cantilever Displacement and Metrology with Blu-Ray Optical Pick-ups funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6501/aad771

Publication URI: http://dx.doi.org/10.1088/1361-6501/aad771

Type: Journal Article/Review

Parent Publication: Measurement Science and Technology

Issue: 10