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Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy (2018)

First Author: Chick S

Attributed to: Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1681-7575/aae2c9

Publication URI: http://dx.doi.org/10.1088/1681-7575/aae2c9

Type: Journal Article/Review

Parent Publication: Metrologia

Issue: 6