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Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits (2017)

First Author: Alrudainy H

Attributed to: Staying alive in variable, intermittent, low-power environments (SAVVIE) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/dft.2017.8244452

Publication URI: http://dx.doi.org/10.1109/dft.2017.8244452

Type: Conference/Paper/Proceeding/Abstract