📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Ion-beam-induced bending of semiconductor nanowires. (2018)

First Author: Hanif I

Attributed to: In-Situ TEM Studies of Ion-Irradiated Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6528/aac659

PubMed Identifier: 29781443

Publication URI: http://europepmc.org/abstract/MED/29781443

Type: Journal Article/Review

Volume: 29

Parent Publication: Nanotechnology

Issue: 33

ISSN: 0957-4484