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Detecting nanometric displacements with optical ruler metrology. (2019)

First Author: Yuan GH

Attributed to: National Hub in High Value Photonic Manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1126/science.aaw7840

PubMed Identifier: 31072905

Publication URI: http://europepmc.org/abstract/MED/31072905

Type: Journal Article/Review

Volume: 364

Parent Publication: Science (New York, N.Y.)

Issue: 6442

ISSN: 0036-8075