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Defect evolution during high temperature tension-tension fatigue of SLM AISi10Mg alloy by synchrotron tomography (2020)

First Author: Bao J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.msea.2020.139809

Publication URI: http://dx.doi.org/10.1016/j.msea.2020.139809

Type: Journal Article/Review

Parent Publication: Materials Science and Engineering: A