📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Achieving Ohmic conduction behavior at high electric field via interface manipulation (2020)

First Author: Zhang X

Attributed to: Equipment Account: Integrated Thin Film Deposition and Analysis System funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2020.146093

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2020.146093

Type: Journal Article/Review

Parent Publication: Applied Surface Science