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Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterisation. (2020)

First Author: Calahorra Y
Attributed to:  Centre for Advanced Materials for Integrated Energy Systems (CAM-IES) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6528/ab9b4b

PubMed Identifier: 32521513

Publication URI: http://europepmc.org/abstract/MED/32521513

Type: Journal Article/Review

Volume: 31

Parent Publication: Nanotechnology

Issue: 40

ISSN: 0957-4484